Uster Fabriq Assistant – Artificial intelligence in fabric inspection
Uster will introduce the latest product for fabric inspection at ITMA 2023. The Uster Fabriq Assistant is a central platform for automated processingRead More…
Category: Testing Equipment
Emtec to reveal innovations in haptic testing of textiles and nonwovens
From June 8-14, 2023 at the ITMA in Milan, Italy, the testing device manufacturer emtec Electronic reveals its latest innovation, which will takeRead More…
emtec Electronic presents device for objective haptic measurement of nonwovens
Leipzig-based manufacturer emtec Electronic GmbH presents an innovative and time-saving device for the objective evaluation of hand-feel and comfort Read More…
Uster invites to a webinar about zero-level contamination control
No fault, no risk Dry-laid nonwovens producers face demands for highest quality levels. The only promising strategy to achieve required “zero-toRead More…
Emtec to present TSA Tactile Sensation Analyzer at India ITME
Germany’s emtec Electronic GmbH will present its TSA Tactile Sensation Analyzer at the India International Textile Machinery Expo from DecemberRead More…
Uster solution gives nonwovens producers total confidence in demanding applications
Drylaid nonwovens producers operate to the most stringent quality levels – with zero-tolerance standards for defects bigger than 1 mm. In this nonwRead More…
TSA from Emtec digitally captures the way fabric feels
The innovative device from emtec Electronic GmbH will be on display at the AATCC Textile Discovery Summit in Charlotte, North Carolina from OctoRead More…
Uster EVS Fabriq Vision – Data-based success for fabric manufacturers
Automated fabric inspection delivers quality and optimization along the process chain UEFV_0019_2.jpg: Uster EVS Fabriq Vision – the fabric qualRead More…
Uster solution for flawless fibers and quality webs in drylaid nonwovens
In medical, hygienic and cosmetic applications flawless end-products are essential. And that means contamination in the fiber raw material is not allRead More…